Electron Spectroscopy for Chemical Analysis
High Pressure Gas Cell
Depth Profiling with Ar+ gun
Charge Compensation for Insulating Samples
Automated 4-axis Sample Manipulator
Avantage Software for Data Acquisition and Analysis
UV Photoelectron Spectroscopy (UPS)
95nm-resolution AES/SEM/SAM Electron Gun
The combination of high efficiency lenses and detectors on ESCALAB 250 ensure the highest sensitivity in X-ray photoelectron spectroscopy (XPS) applications.
ESCALAB 250 provides excellent energy resolution by combining an advanced analyzer design with a twin crystal microfocusing X-ray monochromator.
Fast Parallel Imaging XPS
Parallel imaging produces faster data acquisition with about 3-micron XPS resolution for chemical images. ESCALAB 250 is the instrument to use the same input lens and analyzer for both parallel imaging and spectroscopy.
Auger Electron Spectroscopy
Small Area XPS (SAXPS)
Insulating samples are analyzed using charge compensation with e- and Ar+ flood guns.
Samples should be less than 14mm, preferred size is about 3-5mm. The sample thickness should be less than 3mm.