The Scios FIB/SEM provides imaging and sample preparation capabilities for challenging samples. The FIB column operates between 2-30kV to allow both high material removal rates and minimize surface damage. Pt deposition and nanomanipulator allow liftout capabilities for TEM characterization other sample prep needs. SEM column design and environmental chamber allows imaging of non-conductive and magnetic samples while maintaining high resolution. Multiple secondary electron and backscattered electron detectors are available for imaging as well as a dedicated EBSD detector for orientation mapping.