J.A.Woollam M-2000 Spectroscopic Ellipsometer
The M-2000 ellipsometer is able to collect data across the entire 250– 1700 nm range with about 2 nm resolution. Combined with automated sample alignment, customizable computer controlled X-Y mapping, and focusing probes for small samples, users are able to determine the thickness of thin films and a complex optical function in the ultraviolet, visible, and near infrared spectral ranges.
- Spectral Range 250– 1700 nm
- Typical data acquisition times 1-5 sec
- Collimated light beam
- Focusing optics options
- Auto angle base ranging 45° to 90°, horizontal sample stage
- Automated sample height (Z) alignment, and tilt alignment
- Automated Sample Translation, 200 x 200 mm XY Mapping
- Transmission Mount, holds samples up to 150 mm diameter
- CompleteEASE software for data acquisition & analysis