JEM-F200 Cold FEG Electron Microscope
JEOL JEM-F200 is a 200 kV multi-purpose transmission electron microscope with advanced features that are not found in any other non-aberration corrected TEM. The TEM is equipped with a cold field emission gun (CFEG).
| TEM resolution (at 200 kV) | Point to point: 0.23 nm |
| TEM lattice image: 0.10 nm | |
| STEM dark field: 0.16 nm | |
| Magnification | MAG (at 200kV): xl000 to 2M |
| LOWMAG: x20 to 60,000 | |
| Standard accelerating voltage | 200 kV and 80 kV |
| Spot size (diameter) | TEM mode: 1 to 20nm |
| Probe mode: 0.5nm to 20nm | |
| Convergence angle (200kV): 1.5 to 80 mrad | |
| Additional Techniques | Energy Dispersive X-Ray Spectroscopy Beam Precession 4D STEM Lorentz Imaging |