Key features:

• Copper Kα x-ray source
• Fully programmable MultiCore Optics: i-Core for incident beam, and d-Core for diffracted beam

Available applications:

• X-ray Powder Diffractometry (XPRD)
• Transmission Geometry XPRD
• Small-Angle X-ray Scattering‎ (SAXS)
•  Grazing Incidence X-ray Diffractometry (GIXRD)
•  X-ray Reflectometry (XRR)
• Texture (Pole Figure)
• Residual Stress
• Rocking Curves
• Reciprocal Space Mapping
• Microdiffraction

Stages available:

• Reflection-Transmission Spinner
• 3-Axes cradle with auto chi, phi and Z
• Manual stage - LEVELLING SAMPLE HOLDER, TABLE 140 MM
• Flat sample bracket
• Proportional detector filled with Xe gas for dual scalar electronics

Software: HighScore plus software package, reference database ICDD PDF-4+, X’Pert Epitaxy 4.2, X'Pert Reflectometry, EASYSAXS.