TECHNIQUE(S)

TEM

STEM

EELS

Diffraction

Selected Area diffraction

 

SCHEDULER

FORCE

Resolution

 

 

Acceleration Voltage

Magnification

 

 

Spectrometer

 

 

 

 

 

Illumination System

0.34nm

< 0.20nm

< 1.50nm

120 kV (default) and 80kVLess than 150mm in diameter

8 - 630,000 x

50 - 1,000,000 x

20 - 315 x

 

1.17μm/eV @ 120kV

<1.5eV

< ±1.0%

80 mrad at DE = ±6eV

< 1.0 eV in 2.5 cm at final image plane

Koehler illumination system

 

PICTURE TO BE UPDATED

ZEISS LIBRA 120

Transmission Electron Microscope

Point – Point

Information Limit

STEM

 

TEM

STEM

EELS

Point – Point

Dispersion

Energy resolution

Distortion

Acceptance angle

Isochromaticity

LINKS

Accessories for TEM

www.tedpella.com

www.2spi.com

Nanomaterials Core Characterization Facility

620 West Cary Street

Richmond, Virginia 23284

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