TECHNIQUE(S)

XPS

XPS imaging

AES

ISS

UPS

High pressure gas cell

Depth profiling with Ar+ gun

Charge compensation for insulating samples

BASIC SPECIFICATIONS

Electron Analyzer

• Double-focusing full 180° spherical sector analyzer

• Magnetic and multi-element electrostatic input lenses

• Multi-channel spectroscopic detector

• 3 micron resolution 2-D image detector

 

Microfocused Monochromated

• AlKα X-ray Source

• 0.5 meter Rowland circle

• Microfocused electron gun

• Multi-position aluminum anode

• Two toroidal quartz crystals

 

Flood Gun

• Charge compensation

• Digital control

• Electron imaging

 

Ion Source

• Digital control

• Depth profiling

• Sample cleaning

• Secondary electron imaging

• ISS

 

Automated 4-axis Sample Manipulator

• Interfaced to the data system

 

Avantage Software for data acquisition and analysis

• Instrument control

• Data acquisition and processing, peak fitting

• Multi-sample, multi-point data acquisition

• Unattended data acquisition

 

Sample Options

• 5-axes sample manipulator

• Sample heating and cooling

 

UV Photoelectron Spectroscopy (UPS)

• High intensity UV lamp

• Helium gas admission system

 

95nm-resolution AES/SEM/SAM Electron Gun

• Schottky type field emission source

• SEM detector

 

High Sensitivity

The combination of high efficiency lenses and detectors on ESCALAB 250 ensure the highest sensitivity in X-ray photoelectron spectroscopy (XPS) applications.

 

• High speed acquisition

• Excellent sensitivity with spatial resolution

• 106 counts/s in normal operating conditions (0.6 eV at FWHM, Ag sample)

• Maximum chemical detectability

 

Energy Resolution

ESCALAB 250 provides excellent energy resolution by combining an advanced analyzer design with a twin crystal microfocusing X-ray monochromator.

 

• Identification and quantification of chemical states

• Resolve interfaces and overlapping peaks

 

Fast Parallel Imaging XPS

Parallel imaging produces faster data acquisition with about 3-micron XPS resolution for chemical images. ESCALAB 250 is the instrument to use the same input lens and analyzer for both parallel imaging and spectroscopy.

 

• Imaging of both large and small features

• Eliminates the need to align two sets of electron optics

 

Auger Electron Spectroscopy

• 95 nm spot size at 5 nA

• SEM and SAM imaging

 

Small Area XPS (SAXPS)

• defined by x-rays gun small area from 120μm to 650μm

• Possible Lens defined small area down to < 20 μm

 

Insulators

Insulating samples are analyzed using charge compensation with e- and Ar+ flood guns.

 

Sample Preparation

Samples should be less than 14mm, preferred size is about 3-5mm. The sample thickness should be less than 3mm.

PICTURE TO BE UPDATED

THERMOFISHER ESCALAB 250

Electron Spectroscopy for Chemical Analysis

Nanomaterials Core Characterization Facility

620 West Cary Street

Richmond, Virginia 23284

Director: Everett E Carpenter, Ph.D.

Email: nano@vcu.edu

Copyright ©Virginia Commonwealth University Nanoscience and Nanotechnology Program. All Rights Reserved.