PANalytical X'Pert Pro Diffractometer

X-ray Diffractormeter

Image of PANalytical MPD X'pert Pro

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FORCE

This system is a great tool for identification and quantification of phases for crystalline powders, where the crystallite size is greater than 5nm. It has optics to allow for measurement of samples as small as 1mg, as well as watching crystal structure change as a function of temperature up to 1200C. The NCC has a large powder diffraction file library allowing for identification of over 130,000 different materials.

 

Equipment Features

Temperature stage from RT to 1200 ÂșC
Small angle x-ray scattering stage
Multiple sample holders
Powder sample component analysis
Crystal structure on powder samples
Particle size distribution